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Whether you are interested in improved process control, or doing research and development, understanding your materials starts very often with understanding the powder diffraction pattern.
While Malvern Panalytical helps you in getting the best powder diffraction pattern with our diffractometers, one of your primary concerns is to identify the contents of your sample.
HighScore is the ideal software for phase identification, semi-quantitative phase analysis, pattern treatment, profile fitting and more. The software package contains many supporting functions to display, manipulate and to evaluate your diffraction data, binary options technical analysis software. HighScore can handle all Malvern Panalytical XRD data formats and additionally most of the diffraction patterns from other suppliers.
We continuously innovate and update the HighScore suite to offer you the most comprehensive and user-friendly toolbox for XRD, binary options technical analysis software.
In the newest release version 5. All software functions are seamlessly integrated within the program. Graphics and texts or lists are linked. Editing of graphics results in an immediate update of the text or list, and vice versa. The size, visibility and contents of every graph or text pane can be customized and stored for future use. Some desktops and skins are predefined. Thumbnails help to select the proper raw data or analysis result. Each task can be executed in multiple ways by user-owned parameter sets.
The search-match algorithm in HighScore Plus combines peak and net profile data in a single search step, which usually produces the most reliable results.
It can be tuned to use only peak data acting more discriminative or to use solely profile data and behaving less selective. The candidate clustering feature suppresses multiple entries of similar patterns in the candidates list, making it easier to identify the minor phases in the diffractogram. Altogether, these features make HighScore Plus the preferred software for phase identification. HighScore Plus supports the simultaneous use of reference databases.
You can search through inorganic and organic databases in one go. All types of reference databases, from actual to legacy, from premium-quality ICDD products over mid-priced solutions to free downloadable databases are supported, including the Cambridge Structural Database.
User-owned reference data is kept separate from the commercial databases and can be stored in as many separate user databases as you like. All databases commercial or user-owned can contain reference data, structure data and binary options technical analysis software scans. HighScore Plus works on a copy of a measurement and leaves the original scan untouched. Measured scans, data derived from the measurements and analysis results are organized in documents, binary options technical analysis software.
Each document can contain multiple data sets, which can be processed automatically in a batch. Data exchange between datasets and also between documents is as easy as copy and paste. Each document includes its own analysis history with all analysis steps and the used settings. HighScore Plus offers the possibility to store routinely used sequences of data processing, analysis and reporting steps into user batches.
By one mouse-click, a complete phase identification including reporting is carried out. Further automation is possible by starting HighScore Plus through the command line interface using the Automatic Processing Program. HighScore Plus offers extensive possibilities for reporting.
Reports can be fully customized using Microsoft Word templates, allowing users to add company logos, introductory texts, pictures in combination with any analysis result from the software.
Also, outputs in various ASCII formats can be created for connection to binary options technical analysis software. a LIMS system. Next to the ubiquitous pseudo-Voigt- and Pearson-7 profile functions, HighScore Plus supports a true Voigt function, especially useful for crystallite size and microstrain or line profile analysis.
All profile functions are available unsplit, or single-split in either FHWM or in shape, or double-split to optimally describe asymmetric and complex profiles. The proprietary solver allows the stable refinement of hundreds of peak parameters together without using a parameter turn-on sequence.
Individual peak profiles, the sum profile and the changes in mean FWHM or universal shape along the scan axis are shown in the graphics. HighScore Plus contains a comprehensive help binary options technical analysis software, including theory, algorithms for most functions, binary options technical analysis software, and an up-to-date literature list.
A Quick Start Guide helps you to explore the most common tasks step by step, binary options technical analysis software. The different analysis methods are covered by example data and tutorials that walk the user through the necessary steps and enable comparison of results with the benchmark. Other binary and ASCII file formats from Philips and other major suppliers are imported as well. The analysis results are available in text and graphic formats. Almost every element in HighScore can be selected and copied to the clipboard or exported in various formats for further use.
HighScore supports the simultaneous use of multiple reference databases. All types of reference databases, from actual to legacy, from premium-quality ICDD products over mid-priced solutions to free downloadable databases are supported. Designed for and running on Windows 8.
A PC configuration matching the minimum hardware requirements for the desired Windows operation system will be sufficient. Support of 21 CFR Part 11 with HighScore is possible with the newly release OmniTrust and OmniAccess solutions on Windows operating system.
For existing Audit Trail customers, we have made an End Of Life version of HighScore 4. HighScore 5. Products Products, binary options technical analysis software. Automation solutions Calibration standards CNA cross-belt analyzers Consumables Handheld spectrometers Image analyzers Liquid chromatography Microcalorimeters Near-infrared spectrometers NIR Particle size analyzers Sample preparation for XRF and ICP Software for XRF and XRD applications Spectroradiometers X-ray components X-ray diffractometers XRD X-ray fluorescence spectrometers XRF X-ray metrology X-ray scattering platform X-ray tubes.
Borate Fusion Image analysis Morphologically-Directed Raman Spectroscopy MDRS Light scattering Dynamic Light Scattering DLS Electrophoretic Light Scattering ELS Laser Diffraction LD Multi Angle Light Scattering MALS Multi-angle dynamic light scattering MADLS Static Light Scattering SLS Nanoparticle Tracking Analysis NTA Liquid chromatography Gel Permeation Chromatography GPC Size Exclusion Chromatography SEC Ultra Performance Liquid Chromatography UPLC Microcalorimetry Differential Scanning Calorimetry DSC Isothermal Titration Calorimetry ITC Spatial filter velocimetry Spectroscopy Near-infrared NIR spectroscopy Pulsed Fast Thermal Neutron Activation PFTNA X-ray analysis XRD X-ray diffraction XRF X-ray fluorescence X-ray imaging X-ray scattering.
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Product range. Aeris ASD Axios FAST Claisse CNA Empyrean Epsilon Insitec Mastersizer MicroCal ITC MicroCal DSC Morphologi NanoSight OMNISEC Parsum Spraytec X'Pert³ Zetasizer Zetium ZT. Product category. Measurement type. Industry standards. Our product brands. ASD Claisse Malvern Instruments MicroCal NanoSight PANalytical. Research themes Hot news in research Agriculture and food sciences Biological and medical sciences Chemistry and applied chemistry Civil engineering, architecture, and archaeology Electronic engineering and semiconductor materials Energy, fuel, and automotive engineering Environmental and climate science Geological sciences, minerals, and mining engineering Materials science and engineering Pharmaceutical sciences Physics and applied physics Interact With Us!
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Knowledge Center Application Notes Technical Notes Articles Whitepapers. Events and training Live events Recorded Events User training events. About Us. Products by Product Category Software for XRF and XRD applications X-ray diffraction software HighScore Full pattern approach for phase identification and much more Whether you are binary options technical analysis software in improved process control, or doing research and development, understanding your materials starts very often with understanding the powder diffraction pattern.
Download brochure Request a quote Request a demo Contact sales. Overview Features Specification Overview A continuously developing package We continuously innovate and update the HighScore suite to offer you the most comprehensive and user-friendly toolbox for XRD. A new document format. HPF2; backward compatibility to the former. HPF format is available Support of Monochromatic Cu K-beta wavelength new possibility for the recently released 1Der detector Possibility to describe the profiles using K-edges and white radiation if necessary Improvements in the smart user batches Better K-factor handling Improved reporting Enhanced process and history logs New title bar Better.
BRML Bruker file support. Features Complete integration of all tasks within one user interface All software functions are seamlessly integrated within the program. Powerful search-match algorithm The search-match algorithm in HighScore Plus combines peak and net profile data in a single search step, which usually produces the most reliable results.
Reference databases HighScore Plus supports the simultaneous use of reference databases. Document-based structure with history and multiple datasets HighScore Plus works on a copy of a measurement and leaves the original scan untouched. Automating your analyses HighScore Plus offers the possibility to store routinely used sequences of data processing, analysis and reporting steps into user batches. Making your work easy using automatic reports HighScore Plus offers extensive possibilities for reporting.
State-of-the-art profile fit with 3 model functions and options Next to the ubiquitous pseudo-Voigt- and Pearson-7 profile functions, HighScore Plus supports a true Voigt function, especially useful for crystallite size and microstrain or line profile analysis. Extensive help system and tutorials for self-study HighScore Plus binary options technical analysis software a comprehensive help system, including binary options technical analysis software, algorithms for most functions, and an up-to-date literature list.
Specification Reference databases HighScore supports the simultaneous use of multiple reference databases. Recommended system configuration Designed for and running on Windows 8, binary options technical analysis software.
Request a quote Request a demo Contact sales Download brochure. Contact Us. Knowledge Center. Software Downloads.
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